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The International Symposium on Ubiquitous Information Manufacturing (ISUM)
Author: Update times: 2010-09-12                          | Print | Close | Text Size: A A A

Organized by Shenyang Institute of Automation

Sponsored by the Chinese Academy of Sciences

September 15-16

Shenyang, China

Chair: Tianran WANG, Professor and Member of the Chinese Academy of Engineering

Cochair: Haibin YU

Secretary-General: Yunlong ZHU

Assistant Secretary-General: Wei LIANG

Invited Keynotes at a Glance

Wednesday, September 15, 2010

 

Name

Affiliation

Title of Invited Keynote

1

Prof. Tianran Wang

Shenyang Institute of Automation, CAS

Opening Speech

2

Prof. Haibin Yu

Shenyang Institute of Automation, CAS

Manufacturing in the Ubiquitous Information Environment

3

Prof. Zhiyuan Li

Purdue University

Programming and Diagnosis Tools for Reliable and Secure Wireless Sensor Networks

4

Prof. Yi Liu

The Commonwealth Scientific and Industrial Research Organisation

Online Analysis and Measurement Research and Development for Mineral and Energy Industries

5

Prof. Guoquan Huang

University of Hong Kong

RFID-Enabled Real-Time Ubiquitous Manufacturing Platform

6

Prof. Jay Lee

University of Cincinnati

Advances on Intelligent Maintenance Systems and Prognostics Technologies: Methodology, Tools, and Case Studies

7

Prof. Yang Xiao

University of Alabama

Communication and Security Aspects in Smart Grids

8

Prof. Jindong Tan

Michigan Technological University

Automatic Dietary Assessment for Obesity Management with Mobile Phones

9

Prof. Yungan Wang

Huazhong University of Science and Technology

Freeform Fabrication with Micro-droplet Jetting

Thursday, September 16, 2010 

 

Name

Affiliation

Title of Invited Keynote

1

Prof. Chenghong Wang

National Natural Science Foundation of China

New Directions Related to Manufacturing in the Control Domain

2

Prof. Daping Chu

Cambridge University

Liquid Source Manufacturing for New Device Creation and Printed Electronics

3

Prof. Si-Zhao Qin

University of Southern California

Variability Reduction in Micro-/Nano- Scale Manufacturing

 

 

 

 

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